Re: RFC: Some more store.exp failures - tweak the test

Andrew Cagney
2003-07-01T22:22:34Z

> This patch fixes the store.exp failures for ARM. Two changes:
> - Change char to signed char, because some patterns match -1. If anyone
> prefers changing the patterns to match 255 would work too.

Yes, but use something like `typedef signed char charest' so that the
function's pattern doesn't need tweaking.

> - Change "return l" to "return l + r". "up; print r" doesn't work if
> "r" is not live across the function call; even without optimization
> GCC will re-use the register. Then we lose.

As an aside, isn't that a GCC bug? If no optimization, shouldn't "r"
have a single permenant location? The user's going to expect it to
work, no matter how dumb their code.

> I believe these changes don't impact the point of the test. If nobody
> disagrees with me, I'd like to commit this.

Andrew